发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, FAULT DETECTION METHOD, AND MICROCONTROLLER
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of detecting a fault in an input section connected with the same input/output terminal as an output section independently of an output section. SOLUTION: A switch SW1 is provided between an input section 11 and an input/output terminal P1, and a switch SW2 is provided between the input section 11 and an output section 12. At the inspection of the input section 11, the switch SW1 disconnects electrically the input section 11 and the input/output terminal P1 while the switch SW2 disconnects electrically the input section 11 and the output section 12. An input value generation section 13 enters an input value into the input section 11, and a fault determination section 14 compares the input value with the output value from the input section 11 to determine whether or not any fault occurs in the input section 11. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011038987(A) 申请公布日期 2011.02.24
申请号 JP20090189098 申请日期 2009.08.18
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 YAMAMOTO TOMOHIDE;YOSHIDA TETSUYA
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址