发明名称 OTDR WAVEFORM DETERMINATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an OTDR waveform determination method confirming and selecting an abnormality due to a winding, from an OTDR waveform without performing winding change. SOLUTION: In the OTDR waveform determination method, test light is led from one end of an optical fiber to be measured by an OTDR measuring instrument, a return time data of return light and an optical power of return light are measured, an abnormal site with inclination fluctuation is detected from the measured CTDR data, a loss increment at the detected abnormal site is determined in predetermined wavelengths of two or more wavelengths, wavelength dependency of the loss increment at the abnormal site is determined, and thereby the abnormal site due to the winding is selected. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011038785(A) 申请公布日期 2011.02.24
申请号 JP20090183561 申请日期 2009.08.06
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TEI KANEHIRO;OE MASAMOTO
分类号 G01M11/00 主分类号 G01M11/00
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