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发明名称
Wafer center finding
摘要
A number of wafer center finding methods and systems are disclosed herein that improve upon existing techniques used in semiconductor manufacturing.
申请公布号
US7894657(B2)
申请公布日期
2011.02.22
申请号
US20080032341
申请日期
2008.02.15
申请人
BROOKS AUTOMATION, INC.
发明人
VAN DER MEULEN PETER;BUZAN FORREST T.
分类号
G06K9/00
主分类号
G06K9/00
代理机构
代理人
主权项
地址
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