发明名称 Sensing of memory cells in a solid state memory device by fixed discharge of a bit line
摘要 In one or more of the disclosed embodiments, a memory device is provided that reads a target memory cell by first charging the series string of memory cells to which the target memory cell is coupled. A fixed unit of charge is removed from the charged bit line. The bit line is sensed by sense amplifiers to determine the read voltage (i.e., threshold voltage) applied to a word line coupled to the target cell in order to turn on the target cell. The threshold voltage is indicative of the analog voltage stored on the target memory cell.
申请公布号 US7894271(B2) 申请公布日期 2011.02.22
申请号 US20090605717 申请日期 2009.10.26
申请人 MICRON TECHNOLOGY, INC. 发明人 ROOHPARVAR FRANKIE F.
分类号 G11C16/06 主分类号 G11C16/06
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