发明名称 Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
摘要 There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer.
申请公布号 US7893707(B2) 申请公布日期 2011.02.22
申请号 US20090498844 申请日期 2009.07.07
申请人 TOYO CORPORATION;SHARP KABUSHIKI KAISHA 发明人 INOUE MASARU;SASAKI KUNIHIKO;KURIHARA TAKASHI;KUME YASUHIRO
分类号 G01R31/00 主分类号 G01R31/00
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