发明名称 |
BLANK MASK AND PHOTO MASK AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
<p>PURPOSE: A blank mask for manufacturing a semiconductor or flat panel display device is provided to resolve problems of scum, footing, and skin layer. CONSTITUTION: A blank mask for manufacturing a semiconductor or flat panel display device comprises one or more layers selected from phase shaft layer, light-shielding layer(30) or anti-reflection layer(40) which are laminated on a transparent substrate(10). The concentration of sulfuric acid and ammonium ion is under 100 ppbv on the top layer of the blank mask. A metal ingredient of the light-shielding layer and/or anti-reflection layer contains chrome(Cr). The top layer of the blank mask is treated by HMDS method. The blank mask further contains a photoresist formed on the top layer.</p> |
申请公布号 |
KR20110016737(A) |
申请公布日期 |
2011.02.18 |
申请号 |
KR20090074382 |
申请日期 |
2009.08.12 |
申请人 |
S&STECH CO., LTD. |
发明人 |
NAM, KEE SOO;CHA, HAN SUN;YANG, SIN JU;KIM, JONG MIN |
分类号 |
G03F1/50;G03F1/38;H01L21/027 |
主分类号 |
G03F1/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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