发明名称 |
METHOD FOR EVALUATING OPTICAL SYSTEM |
摘要 |
PURPOSE: A method of evaluating an optical system is provided to enable the profile, distortion and illuminance of a spot to be simultaneously measured since the position of the spot can be estimated using a wave function. CONSTITUTION: A method of evaluating an optical system is as follows. A spot, which passes through a lens unit, is formed using a lighting unit(S410). The spot is defocused. The intensities of defocused lights on at least two positions are measured using a sensor unit(S420). The information of the spot is obtained using the measured intensities of the lights. The information of the spot is obtained by the calculating of a phase from the intensity change of the lights on a first position and a second position(S440). The information of the spot comprises a profile, distortion and illuminance.
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申请公布号 |
KR20110016515(A) |
申请公布日期 |
2011.02.18 |
申请号 |
KR20090074039 |
申请日期 |
2009.08.12 |
申请人 |
KOREA POLYTECHNIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION |
发明人 |
JOO, WON DON;JUNG, MEE SUK |
分类号 |
G01J1/28;G03F7/20 |
主分类号 |
G01J1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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