发明名称 METHOD FOR EVALUATING OPTICAL SYSTEM
摘要 PURPOSE: A method of evaluating an optical system is provided to enable the profile, distortion and illuminance of a spot to be simultaneously measured since the position of the spot can be estimated using a wave function. CONSTITUTION: A method of evaluating an optical system is as follows. A spot, which passes through a lens unit, is formed using a lighting unit(S410). The spot is defocused. The intensities of defocused lights on at least two positions are measured using a sensor unit(S420). The information of the spot is obtained using the measured intensities of the lights. The information of the spot is obtained by the calculating of a phase from the intensity change of the lights on a first position and a second position(S440). The information of the spot comprises a profile, distortion and illuminance.
申请公布号 KR20110016515(A) 申请公布日期 2011.02.18
申请号 KR20090074039 申请日期 2009.08.12
申请人 KOREA POLYTECHNIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION 发明人 JOO, WON DON;JUNG, MEE SUK
分类号 G01J1/28;G03F7/20 主分类号 G01J1/28
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