发明名称 WAFER CLEANING APPARATUS AND METHOD AFTER WAFER BACK GRIND PROCESS
摘要 PURPOSE: A wafer cleaning apparatus and a method thereof are provided to solve the problem of defective device due to the corrosion of the pad by implementing the cleaning process by cleansing water spraying, dipping, and pure water dipping. CONSTITUTION: A plurality of wafers(W) is dipped in a cleaning tub(1). A cleaning solution supplying unit(20) supplies the cleaning solution inside the cleaning tub. A nozzle(25) sprays the cleansing water supplied from the cleaning solution supplying unit towards the wafer accepted within the cleaning tub. A DIW supply unit(10) supplies the DIW inside the cleaning tub.
申请公布号 KR20110016765(A) 申请公布日期 2011.02.18
申请号 KR20090074426 申请日期 2009.08.12
申请人 DONGBU HITEK CO., LTD. 发明人 LEE, CHEA GAB
分类号 H01L21/302;H01L21/304 主分类号 H01L21/302
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