发明名称 METHOD OF QUANTITATING Sn OXIDE AND METHOD OF EVALUATING FLUX
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of quantitating an Sn oxide, capable of accurately quantitating the composition and amount of an oxide film formed on the surface of an Sn-based plating material, as well as, to provide a method of evaluating flux capable of accurately evaluating the active force of flux for soldering. <P>SOLUTION: By the method of quantitating an Sn oxide, an Sn-based plating material formed on the surface of an Sn oxide is dipped into a prescribed ammoniac buffer solution, electrolytic reduction treatment of the Sn oxide is performed by a chronopotentiometry method or a voltammetry method, and the Sn oxide is quantitated from reduction potential and the amount of electricity required for reduction. The method of evaluating flux includes a first quantitative process for quantitating the Sn oxide in the plating material; a heating process for coating the plating material with flux for heating to soldering temperature; and a second quantitative process for quantitating the Sn oxide in the plating material after heating; and by the method of evaluating flux, the active force of flux is evaluated by the reduction ratio obtained from the amount of Sn oxide acquired in the first and second quantitative processes. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011033377(A) 申请公布日期 2011.02.17
申请号 JP20090177468 申请日期 2009.07.30
申请人 AUTONETWORKS TECHNOLOGIES LTD;SUMITOMO WIRING SYST LTD;SUMITOMO ELECTRIC IND LTD 发明人 KINOSHITA YUKO;FURUKAWA KINGO;NAKAYAMA MOKICHI;SUGIHARA TAKAYASU
分类号 G01N27/48;G01N1/28 主分类号 G01N27/48
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