发明名称 MICROSCOPE AND SAMPLE OBSERVATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a high resolution microscope using terahertz waves without requiring introduction of a fluorescence marker into a sample. SOLUTION: A microscope apparatus 11 includes an ultra-short pulse laser generation unit 12 generating an ultra-short pulse laser beam P3, and a terahertz wave generation unit 14 generating a terahertz wave T1. A microscope part 15 multiplexes the terahertz wave T1 and the ultra-short pulse laser beam P3 to apply them to the sample 151, and on the sample 151, detects a signal S, which is formed by a parametric process and includes a componentω3=ω1±ω2 as a sum frequency or a difference frequency of a frequencyω1 of the ultra-short pulse laser beam P3 and a frequencyω2 of the terahertz wave T1. The detected signal S is turned into an image in an image displaying-recording device 16. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011033700(A) 申请公布日期 2011.02.17
申请号 JP20090177806 申请日期 2009.07.30
申请人 AISIN SEIKI CO LTD 发明人 OTAKE HIDEYUKI
分类号 G02B21/06;G01N21/64;G02B21/36 主分类号 G02B21/06
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