发明名称 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 A resist composition that includes a base component (A) that exhibits changed solubility in an alkali developing solution under the action of acid, an acid generator component (B) that generates acid upon exposure, and an epoxy resin (G). Also, a method of forming a resist pattern that includes using the above resist composition to form a resist film on the substrate, conducting exposure of the resist film, and alkali-developing the resist film to form a resist pattern.
申请公布号 US2011039207(A1) 申请公布日期 2011.02.17
申请号 US20100820899 申请日期 2010.06.22
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 HIRANO ISAO;HATO TOSHIAKI
分类号 G03F7/004;G03F7/20 主分类号 G03F7/004
代理机构 代理人
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