| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device that secures reliability by maintaining functions as a device even if a short-circuit failure occurs in a capacitive element in a semiconductor device mounted with a large-scale capacitive element. <P>SOLUTION: The semiconductor device includes a plurality of capacitance units connected in parallel between a first voltage and a second voltage. Each of the plurality of capacitance units includes a capacitive element and a capacitance disconnecting circuit. One node of the capacitive element is connected to the first voltage. The capacitance disconnecting circuit is connected between the second voltage and the other node of the capacitive element. The capacitance disconnecting circuit has a nonvolatile memory cell whose threshold voltage is changed by a leakage current flowing in from the capacitive element. The capacitance disconnecting circuit blocks off the leakage current flowing out of the capacitive element to the second voltage on the basis of a rise in the threshold voltage of the nonvolatile memory cell when the leakage current flowing in from the capacitive element exceeds a prescribed value. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
