发明名称 |
SUBSTRATE POLISHING APPARATUS AND METHOD OF POLISHING SUBSTRATE USING THE SAME |
摘要 |
PURPOSE: An apparatus and a method for polishing substrates are provided to improve the polishing efficiency of the substrates by measuring the worn degree of the upper side of a pad supporting unit. CONSTITUTION: A substrate(70) is loaded on a substrate support unit. The polishing unit(300) includes a polishing pad(311) polishing the substrate and a pad driving unit. The pad driving unit moves the polishing pad in order to change the relative position of the polishing pad. A pad supporting unit(401) includes a thickness detecting unit(441) measuring the worn degree of the upper side the polishing pad. The pad supporting unit includes a supporting body(410) installed at one side of the substrate support unit and a supporting pad(424).
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申请公布号 |
KR20110015996(A) |
申请公布日期 |
2011.02.17 |
申请号 |
KR20090073479 |
申请日期 |
2009.08.10 |
申请人 |
SEMES CO., LTD. |
发明人 |
CHOI, KI HOON;OH, SE HOON |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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