| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a contact probe which allows a first plunger and a second plunger to be in sure contact and allows an object under inspection, such as, a semiconductor integrated circuit and an inspection board to be connected with each other, with electrical stability and low resistance, and to provide a socket which includes the probe. <P>SOLUTION: In the first plunger 1, a sliding surface with respect to the second plunger 2 of a part positioned outside a coil spring 3 in the expansion/contraction direction of the coil spring 3 (a flange 12 and a tip side body 13) is partially formed to be an inclined part 15. In the process a first state (an open state), in which the coil spring 3 expands changes into a second state (a compressed state) in which the coil spring 3 contracts, a sliding part 21 of the second plunger 2 deforms into a leaf spring shape and runs upon the inclined part 15 of the first plunger 1. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
