发明名称 VARIABLE FEATURE INTERFACE THAT ALLOWS A BALANCED STRESS TO PREVENT THIN DIE WARPAGE
摘要 A packaged semiconductor product includes a packaging substrate coupled to a semiconductor die through an interconnect structure with elements of variable features. The interconnect structure may be bumps or pillars. The variable features of the interconnect structure induce a reverse bend on the semiconductor die that mitigates warpage of the semiconductor die during semiconductor assembly by balancing bending of the packaging substrate during reflow. The variable features can be variable height and/or variable composition.
申请公布号 WO2011020038(A2) 申请公布日期 2011.02.17
申请号 WO2010US45499 申请日期 2010.08.13
申请人 QUALCOMM INCORPORATED;CHANDRASEKARAN, ARVIND;RADOJCIC, RATIBOR 发明人 CHANDRASEKARAN, ARVIND;RADOJCIC, RATIBOR
分类号 H01L23/485 主分类号 H01L23/485
代理机构 代理人
主权项
地址