发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device capacitor manufacturing method is provided to prevent the bridge between adjacent storage nodes by compensating the bowing phenomenon by depositing the compensation insulation layer made of low temperature oxidation layer. CONSTITUTION: An etch stopping layer(24) and a mold dielectric film(25) are successively formed on the top of a semiconductor substrate(21). An open area(27) is formed by etching the mold insulation layer with the photosensitive pattern as the etching barrier. A compensation insulating layer(28B) for correcting the bowing profile is formed on the sidewall of the open area.
申请公布号 KR20110016215(A) 申请公布日期 2011.02.17
申请号 KR20090073811 申请日期 2009.08.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG YEOP;LEE, KEE JEUNG;KIM, YOUNG DAE;DO, KWAN WOO;PARK, KYUNG WOONG
分类号 H01L27/108 主分类号 H01L27/108
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