发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED GATE
摘要 <p>PURPOSE: A semiconductor device manufacturing method equipped with a burying gate is provided to form the structure of a gap fill layer stably by forming a second gap fill layer on a first gap fill layer. CONSTITUTION: A trench(26) is formed by etching using the hard mask film on a substrate(21). A buried gate(28A) filling a part of the trench is formed. A first gap-fill film(29A) filling the top of the buried gate is formed. An etch stopping layer(30A) is formed on the front surface including the first gap-fill film. A second gap-fill film(34A) covering the first gap-fill film is formed on the etch stopping layer.</p>
申请公布号 KR20110016214(A) 申请公布日期 2011.02.17
申请号 KR20090073810 申请日期 2009.08.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SOON YOUNG;OH, KEE JOON
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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