发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED GATE |
摘要 |
<p>PURPOSE: A semiconductor device manufacturing method equipped with a burying gate is provided to form the structure of a gap fill layer stably by forming a second gap fill layer on a first gap fill layer. CONSTITUTION: A trench(26) is formed by etching using the hard mask film on a substrate(21). A buried gate(28A) filling a part of the trench is formed. A first gap-fill film(29A) filling the top of the buried gate is formed. An etch stopping layer(30A) is formed on the front surface including the first gap-fill film. A second gap-fill film(34A) covering the first gap-fill film is formed on the etch stopping layer.</p> |
申请公布号 |
KR20110016214(A) |
申请公布日期 |
2011.02.17 |
申请号 |
KR20090073810 |
申请日期 |
2009.08.11 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, SOON YOUNG;OH, KEE JOON |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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