发明名称 METHOD AND APPARATUS FOR MEASURING ZETA POTENTIAL OF SUSPENDED PARTICLES
摘要 A zeta potential measurement system comprising: a cell having a cell wall and bottom for holding suspended particles; an optical measurement probe having a probe tip comprising a transparent and conducting thin film coating which prevents ionic current from accumulating charge on the probe tip, and wherein the optical measurement probe is inserted through the cell wall such that the probe tip is in fluid communication with the sample; a counter electrode inserted through the cell wall opposite to the optical measurement probe; a laser source which is disposed so as to deliver light to the optical measurement probe via an optical directional coupler and optical waveguide; wherein the optical measurement probe focuses the light onto a front surface of the probe tip, such that the light reflected from the front surface of the optical measurement probe and light backscattered from particles in the sample are collected by the probe tip, and thereafter focused to a optical waveguide and delivered through the coupler to a photodetector; an electrical output of the photodetector is connected to a filtering and amplification module, wherein an analog output of the amplification module is connected to an analog-to-digital converter, wherein the analog-to-digital converter creates a digital data stream which is stored in a first memory; and a computer or microprocessor which calculates the frequency power spectrum from the stored digital data stream and stores the frequency power spectrum in a second memory, wherein the first and second memories can be either the same or different.
申请公布号 US2011037980(A1) 申请公布日期 2011.02.17
申请号 US20090539340 申请日期 2009.08.11
申请人 MICROTRAC INC. 发明人 FREUD PAUL J.;TRAINER MICHAEL N.
分类号 G01N21/00;G01N31/00;G06F19/00 主分类号 G01N21/00
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