发明名称 DATA CONTROL CIRCUIT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor memory capable of reducing leakage current in a circuit associated with a global input/output line when a reading or writing operation is performed. <P>SOLUTION: The data control circuit includes: an input/output line precharge unit for precharging a global input/output line when a reading or writing operation is not performed; and a driver that includes a plurality of MOS transistors, and receives, when the reading operation is performed, data of a local input/output line and a reverse local input/output line to drive the global input/output line. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011034660(A) 申请公布日期 2011.02.17
申请号 JP20100073492 申请日期 2010.03.26
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE SANG KWON
分类号 G11C11/4096;G11C11/4091 主分类号 G11C11/4096
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