发明名称 METHOD FOR QUANTIFYING THE MANUFACTURING COMPLEXITY OF ELECTRICAL DESIGNS
摘要 A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design.
申请公布号 US2011038525(A1) 申请公布日期 2011.02.17
申请号 US20100914367 申请日期 2010.10.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CRANMER MICHAEL S.;SURPRENANT RICHARD P.
分类号 G06K9/00 主分类号 G06K9/00
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