发明名称 Solid state imaging device having a photodiode and a MOSFET
摘要 <p>A solid state imaging device comprising: a gate insulating film (12) formed on a semiconductor substrate (11) of a first conductivity type; a readout gate electrode (13a) selectively formed on the gate insulating film (12); a diffusion region (14a) of a second conductivity type formed at a surface within the semiconductor substrate (11) at one end of the readout gate electrode (13a); a signal storage region (15) of the second conductivity type formed at the surface within the semiconductor substrate (11) at other end of the readout gate electrode (13a); a surface shield region (21) of the first conductivity type formed at a surface within the signal storage region (15); a silicide block layer (19) covering at least part of the signal storage region (15); and a metal silicide layer (24a) formed on the diffusion region (14a), wherein the readout gate electrode (13a) comprises a first gate electrode; a second gate electrode (13b) is provided on an element isolation region (STI), and the silicide block layer (19) is formed between the first and second gate electrodes.</p>
申请公布号 EP2284896(A1) 申请公布日期 2011.02.16
申请号 EP20100188193 申请日期 2001.03.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NOZAKI, HIDETOSHI;INOUE, IKUKO;YAMASHITA, HIROFUMI
分类号 H01L21/28;H01L27/146;H01L21/8238;H01L27/092;H01L29/41;H01L29/417;H04N5/335;H04N5/357;H04N5/369;H04N5/374 主分类号 H01L21/28
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