发明名称 |
Solid state imaging device having a photodiode and a MOSFET |
摘要 |
<p>A solid state imaging device comprising:
a gate insulating film (12) formed on a semiconductor substrate (11) of a first conductivity type;
a readout gate electrode (13a) selectively formed on the gate insulating film (12);
a diffusion region (14a) of a second conductivity type formed at a surface within the semiconductor substrate (11) at one end of the readout gate electrode (13a);
a signal storage region (15) of the second conductivity type formed at the surface within the semiconductor substrate (11) at other end of the readout gate electrode (13a);
a surface shield region (21) of the first conductivity type formed at a surface within the signal storage region (15);
a silicide block layer (19) covering at least part of the signal storage region (15); and
a metal silicide layer (24a) formed on the diffusion region (14a), wherein
the readout gate electrode (13a) comprises a first gate electrode;
a second gate electrode (13b) is provided on an element isolation region (STI), and
the silicide block layer (19) is formed between the first and second gate electrodes.</p> |
申请公布号 |
EP2284896(A1) |
申请公布日期 |
2011.02.16 |
申请号 |
EP20100188193 |
申请日期 |
2001.03.02 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
NOZAKI, HIDETOSHI;INOUE, IKUKO;YAMASHITA, HIROFUMI |
分类号 |
H01L21/28;H01L27/146;H01L21/8238;H01L27/092;H01L29/41;H01L29/417;H04N5/335;H04N5/357;H04N5/369;H04N5/374 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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