发明名称 METHOD AND APPARATUS TO CONTROL SEMICONDUCTOR FILM DEPOSITION CHARACTERISTICS
摘要 Methods are disclosed for adjusting the temperature of at least a portion of the surface of a reaction chamber during a film formation process to control film properties. More than one portion of the chamber surface may be temperature-modulated, and may be accomplished by actively keeping the temperature of a first wall of the reaction chamber above the temperature of a second wall during the film formation process.
申请公布号 KR101014907(B1) 申请公布日期 2011.02.15
申请号 KR20087005790 申请日期 2006.08.08
申请人 发明人
分类号 C23C16/00;H01L21/205 主分类号 C23C16/00
代理机构 代理人
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