发明名称 PRINTED CIRCUIT BOARD BEING ENABLE TO TEST EMBEDDED ELECTRIC ELEMENT
摘要 PURPOSE: A printed circuit board being enable to a test embedded electric element is provided to perform embedded electrical component by including a reference pad for inspecting high frequency. CONSTITUTION: A printed circuit board(10) comprises electrical device components(11a,11b), a reference pad(13) for inspecting high frequency, and a signal pad(12). The electrical device component is built in the printed circuit board. The signal pad is connected to the I/O terminal of the electrical device component. The signal pad is connected with an inspection signal transmission line of a high frequency test probe. The reference pad for inspecting high frequency is connected to the connection line of the ground line of the high frequency test probe.
申请公布号 KR20110015209(A) 申请公布日期 2011.02.15
申请号 KR20090072811 申请日期 2009.08.07
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 LIM, JUN;KIM, HYUN HO
分类号 H05K1/02;H05K13/08 主分类号 H05K1/02
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