| 摘要 |
A method for determining, for each of at least p physical parameters of one or several components of an electronic circuit or of a microelectromechanical system, a number n of experiment values of the physical parameter includes determining n vectors of dimension p, each component of each of the vectors corresponding to one of n initial values of one of physical parameters; and iteratively modifying at least some of the n vectors to bring to a maximum, at least locally, for each pair of vectors from among pairs of n vectors, the smallest average of the sum of distances between the vectors of said pair projected onto sub-spaces of dimension k, where k belongs to a set of integers ranging between 1 and p and at least comprising 1, 2, and p, the components of each of the n vectors corresponding, at the end of the iterations, to experiment values.
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