发明名称 FOTOLEITFÄHIGES BAUELEMENT
摘要 <p>A semiconductor structure includes a GaAs or InP substrate, an In<SUB>x</SUB>Ga<SUB>1-x</SUB>As epitaxial layer grown on the substrate, where x is greater than about 0.01 and less than about 0.53, and a wider bandgap epitaxial layer grown as a cap layer on top of the In<SUB>x</SUB>Ga<SUB>1-x</SUB>As epitaxial layer.</p>
申请公布号 AT496398(T) 申请公布日期 2011.02.15
申请号 AT20050853521T 申请日期 2005.12.07
申请人 PICOMETRIX, LLC 发明人 SACKS, ROBERT;JAZWIECKI, MATHEW;WILLIAMSON, STEVEN
分类号 H01L31/09 主分类号 H01L31/09
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