发明名称 VARIABLE RESISTANCE MEMORY DEVICE AND PROGRAM METHOD THEREOF
摘要 PURPOSE: A variable resistance memory device and a programming method thereof are provided to increase the lifetime of a device by reducing a switching current inputted to a variable resistance device. CONSTITUTION: A bypass circuit(130) bypasses a switching current inputted to a variable resistance memory cell. A voltage sensor outputs a control signal according to the set state of the variable resistance memory cell. A bypass transistor is connected in parallel to a variable resistance memory cell(120). An inverter inverts the voltage of an input terminal of the pulse and provides the inverted signal as a control signal. A delay circuit(110) outputs a control signal by delaying the set pulse.
申请公布号 KR20110015256(A) 申请公布日期 2011.02.15
申请号 KR20090072889 申请日期 2009.08.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, HONG SIK;ZHAO JINSHI;BAEK, IN GYU;SIM, HYUN JUN;PARK, MIN YOUNG
分类号 G11C16/00;G11C16/12;G11C16/34 主分类号 G11C16/00
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