| 摘要 |
PURPOSE: A contact prove pin is provided to maintain stable electrical contact for long time by securing excellent conductivity in end and low adhesion to a target in other area. CONSTITUTION: The tip(11) of a contact probe pin(10) is contacted with an electrode(12) as a subject under a test The contact reduces the interference of the oxide film formed on the surface of the electrode. The end of contact probe pin is formed to be sharp. The contact probe pin includes a carbon film containing at least one of a base member, a metal, and carbide. The contact probe pin testing a plurality of electronic components is repetitively contacted with the electrode to pass current. |
