发明名称 Method for atomic layer deposition of materials using an atmospheric pressure for semiconductor devices
摘要 A method for atomic layer deposition. The method includes providing a substrate having a surface region and exposing the surface region of the substrate to an atmospheric pressure. The method also maintains at least the substrate at about the atmospheric pressure and forms a film overlying the surface region using atomic layer deposition, while the substrate is maintained at about atmospheric pressure. Preferably, the film is grown at a rate of greater than about 1 nanometer per minute.
申请公布号 US7887884(B2) 申请公布日期 2011.02.15
申请号 US20050243735 申请日期 2005.10.04
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 MIENO FUMITAKE
分类号 C23C16/00 主分类号 C23C16/00
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