发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To reduce the resistance of each member included in a transistor, to improve ON current of the transistor, and to improve performance of an integrated circuit. <P>SOLUTION: A semiconductor device includes an n-channel FET and a p-channel FET which are provided on a single crystal semiconductor substrate with an insulating layer provided therebetween and are isolated by an element isolation insulating layer. In the semiconductor device, each FET includes: a channel formation region including a semiconductor material; a conductive region which is in contact with the channel formation region and includes the semiconductor material; a metal region in contact with the conductive region; a gate insulating layer in contact with the channel formation region; a gate electrode in contact with the gate insulating layer; and a source or drain electrode partly including the metal region. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011029610(A) |
申请公布日期 |
2011.02.10 |
申请号 |
JP20100136048 |
申请日期 |
2010.06.15 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI |
分类号 |
H01L29/786;H01L21/02;H01L21/28;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L27/12;H01L29/41;H01L29/417;H01L29/423;H01L29/49 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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