发明名称 SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce the resistance of each member included in a transistor, to improve ON current of the transistor, and to improve performance of an integrated circuit. <P>SOLUTION: A semiconductor device includes an n-channel FET and a p-channel FET which are provided on a single crystal semiconductor substrate with an insulating layer provided therebetween and are isolated by an element isolation insulating layer. In the semiconductor device, each FET includes: a channel formation region including a semiconductor material; a conductive region which is in contact with the channel formation region and includes the semiconductor material; a metal region in contact with the conductive region; a gate insulating layer in contact with the channel formation region; a gate electrode in contact with the gate insulating layer; and a source or drain electrode partly including the metal region. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011029610(A) 申请公布日期 2011.02.10
申请号 JP20100136048 申请日期 2010.06.15
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;H01L21/02;H01L21/28;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L27/12;H01L29/41;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/786
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