发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device for inspecting a measuring object at various angles, while it is not only moved in the x, y and z axial directions but also rotated, in order to secure reliability of a product, after a component is mounted to a PCB (printed circuit board) and soldered in an electric electronic product manufacturing process. SOLUTION: The X-ray inspection device includes a stage disposed inside a case, an X-ray tube and a detector, makes the measuring object to be mounted on the stage, irradiates it with X-rays using the X-ray tube, images it with the detector, and inspects the measuring object. The stage includes a rotating stage constituted to be rotatable, and a circular rotating stage rotatably disposed in a part punched eccentrically to one side. In the rotating stage, a connecting rod is constituted in the lower part thereof, a rotating motor is attached to the lower level of the connecting rod. The rotating motor is fixed to the stage by a fixing frame, and the rotating stage is rotated by rotation of the rotating motor. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011027740(A) 申请公布日期 2011.02.10
申请号 JP20100165356 申请日期 2010.07.22
申请人 XAVIS CO LTD 发明人 KIM HYEONG CHEOL;LEE SANG EUI;KIM HYOUNG JAE
分类号 G01N23/04;G21K5/00;H05G1/26;H05G1/32 主分类号 G01N23/04
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