| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a driver circuit which reduces a degree of characteristic deterioration of a thin-film transistor, reduces malfunctions within the circuit and guarantees higher-certainty operation. <P>SOLUTION: In a pulse output circuit provided in a shift register, a gate electrode of a transistor is brought into a floating state so as to turn on the gate electrode during a non-selection period, in which a pulse is not outputted. The gate electrode of the transistor is connected to a node, and a potential is supplied periodically to the node by providing a clock signal so as to be inputted to the gate electrode of the transistor. Furthermore, in the gate of a transistor which performs a boostrap operation, a transistor is provided whose gate is connected to a fixed potential. <P>COPYRIGHT: (C)2011,JPO&INPIT |
