发明名称 CMOS STRUCTURE WITH MULTIPLE SPACERS
摘要 A semiconductor device includes a substrate having shallow trench isolation and source/drain regions located therein, a gate stack located on the substrate between the source/drain regions, a first gate spacer on the sidewall of the gate stack, and a second gate spacer on the sidewall of the first gate spacer.
申请公布号 US2011031538(A1) 申请公布日期 2011.02.10
申请号 US20100757517 申请日期 2010.04.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIEH BOR CHIUAN;CHUNG HAN-PING;KO CHIH-HSIN;CHAN BOR-WEN;TAO HUN-JAN
分类号 H01L29/78;H01L29/49 主分类号 H01L29/78
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