发明名称 CHARGED PARTICLE EXTRACTING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a charged particle extracting device and a method capable of stably extracting charged particles. SOLUTION: A high frequency signal generating circuit 100 uses high frequency knockout for extracting charged particles while outputting, to RFKO equipment 28, high frequency signals having a plurality of frequency bands separated from one another each including a round frequency f<SB>rev</SB>of an accelerator showing a knockout frequency f<SB>KO</SB>=(m±q)f<SB>rev</SB>where q is a value after a decimal point for a betatron frequency per round of the accelerator, and m is an integer of 0 and 1 or greater and different. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011028983(A) 申请公布日期 2011.02.10
申请号 JP20090173122 申请日期 2009.07.24
申请人 NIHON UNIV 发明人 NAKANISHI TETSUYA
分类号 H05H13/04;H05H7/10 主分类号 H05H13/04
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