发明名称 ESD PROTECTION
摘要 An electrostatic discharge protection structure (200) for an integrated circuit, the electrostatic discharge protection structure (200) comprising: a first silicon controlled rectifier structure (211) having a first triggering voltage, the first rectifier structure (211) being directly connected to an input (250) of the electrostatic discharge protection structure (200); a second silicon controlled rectifier structure (222) having a second triggering voltage lower than the first triggering voltage, the second rectifier structure (222) being connected to the input (250) via a resistor (221); and a secondary over-voltage protection unit (231) connected to the input (250) via the resistor (221).
申请公布号 US2011032648(A1) 申请公布日期 2011.02.10
申请号 US20090936637 申请日期 2009.03.03
申请人 NXP B.V. 发明人 DARTHENAY FREDERIC;SMEDES TAEDE;JACQUET SEBASTIEN
分类号 H02H9/00 主分类号 H02H9/00
代理机构 代理人
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