发明名称 OSCILLOSCOPE MEASURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To perform a plurality of measurements with a real time oscilloscope. <P>SOLUTION: Required setting of the oscilloscope is performed, and a 10GBASE-T signal is taken (step 10). Spectrum analysis of a waveform is performed, but two peak values of tone frequency are found, and a third peak is found on a spectrum (steps 12 and 14). The spectrum level between a tone of low amplitude and the third peak level is measured, and SFDR is measured (step 16). Next, in step 18, a measured value is compared with the limit value which is reached based on the identified tone frequency, and acceptance or disqualification is determined (step 18). <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011027729(A) 申请公布日期 2011.02.10
申请号 JP20100146792 申请日期 2010.06.28
申请人 TEKTRONIX INC 发明人 P E RAMESH;PICKERD JOHN J
分类号 G01R13/20 主分类号 G01R13/20
代理机构 代理人
主权项
地址