发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A memory includes active areas and an isolation on a semiconductor substrate. A tunnel dielectric film is on active areas. Floating gates include lower gate parts and upper gate parts. An upper gate part has a larger width than that of a lower gate part on a cross section perpendicular to an extension direction of an active area, and is provided on the lower gate part. An intermediate dielectric film is on an upper surface and a side surface of each floating gate. The control gate is on an upper surface and a side surface of each floating gate via the intermediate dielectric film. A height of a lower end of each control gate from a surface of the semiconductor substrate is lower than a height of an interface between the upper gate part and the lower gate part from the surface of the semiconductor substrate.
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申请公布号 |
US2011031549(A1) |
申请公布日期 |
2011.02.10 |
申请号 |
US20100848363 |
申请日期 |
2010.08.02 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KONDO MASAKI;ISOBE KAZUAKI |
分类号 |
H01L27/115;H01L21/8247;H01L29/788 |
主分类号 |
H01L27/115 |
代理机构 |
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