发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY DEVICE
摘要 A memory includes active areas and an isolation on a semiconductor substrate. A tunnel dielectric film is on active areas. Floating gates include lower gate parts and upper gate parts. An upper gate part has a larger width than that of a lower gate part on a cross section perpendicular to an extension direction of an active area, and is provided on the lower gate part. An intermediate dielectric film is on an upper surface and a side surface of each floating gate. The control gate is on an upper surface and a side surface of each floating gate via the intermediate dielectric film. A height of a lower end of each control gate from a surface of the semiconductor substrate is lower than a height of an interface between the upper gate part and the lower gate part from the surface of the semiconductor substrate.
申请公布号 US2011031549(A1) 申请公布日期 2011.02.10
申请号 US20100848363 申请日期 2010.08.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KONDO MASAKI;ISOBE KAZUAKI
分类号 H01L27/115;H01L21/8247;H01L29/788 主分类号 H01L27/115
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