| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a profile measuring device which can accurately estimate the profile of an object in a short period of time. <P>SOLUTION: The profile measuring device includes an oscillating circuit 122 for generating a plurality of carrier waves, a plurality of transmitting circuits 124 for modulating the plurality of the carrier waves using a modular signal, a plurality of transmitting antennas 130A-130C for radiating the plurality of the carrier waves modulated by the plurality of the transmitting circuit 124 as a plurality of radiation waves, a plurality of receiving antenna 140A-140C for receiving a plurality of reflected waves which are a part of each of the plurality of the radiation waves reflected from the object, a plurality of receiving circuits 125 for obtaining a plurality of correlation waveforms which show the correlation between the plurality of the reflected waves received by the plurality of the receiving antenna 140A-140C and the plurality of the radiating waves, and a signal processing circuit 150 for estimating the profile of the object based on the plurality of the correlation waveforms, wherein the frequency of the plurality of the carrier waves are independently set. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
