| 摘要 |
PROBLEM TO BE SOLVED: To always restrict information to a fixed amount or less, when transferring differential data in order to reduce the amount of information. SOLUTION: A semiconductor testing device includes a transmitting device 4 and a receiving device 5. The transmitting device 4 includes a differential data generation part 15 for generating a difference between front and rear device data as the differential data, and a specific code generation part 15 for generating a specific code having an amount of information below a threshold when the amount of information in the differential data exceeds the set threshold. The receiving device 5 includes a data addition part 24 for restoring device data by adding the differential data to just prior device data when receiving the differential data, and an error data generation part 25 for generating error data showing that the device data are error when receiving the specific code. COPYRIGHT: (C)2011,JPO&INPIT
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