发明名称 METHOD OF MANUFACTURING SOI WAFER, AND SOI WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing an SOI wafer which has a thick silicon oxide film of, for example, ≥1 μm adaptive to high-voltage use, and to provide the SOI wafer. SOLUTION: The method of manufacturing the SOI wafer includes at least a step of forming a CVD oxide film of ≥1 μm in thickness on a first silicon substrate and a step of sticking the first silicon substrate and the second silicon substrate on each other with the CVD oxide film interposed, and includes an annealing step of carrying out annealing at 1,100 to 1,300°C being included at least after the step of forming the CVD oxide film, or either before or after the step of sticking the silicon substrates. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011029594(A) 申请公布日期 2011.02.10
申请号 JP20100091210 申请日期 2010.04.12
申请人 SHIN ETSU HANDOTAI CO LTD;NAGANO ELECTRONICS INDUSTRIAL CO LTD 发明人 OTSUKI TAKESHI;MITANI KIYOSHI;YOSHIDA KAZUHIKO
分类号 H01L21/02;H01L27/12 主分类号 H01L21/02
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