发明名称 |
EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, METHOD FOR MANUFACTURING EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, AND SEMICONDUCTOR ELEMENT |
摘要 |
Disclosed is a nitride epitaxial substrate using single-crystal silicon as a base substrate and having excellent quality and characteristics. Specifically disclosed is an epitaxial substrate configured by forming a group-III nitride layer group on a (111) single-crystal silicon substrate such that the (0001) crystal plane is approximately parallel to the substrate surface, the epitaxial substrate being provided with a first group-III nitride layer produced from AlN and formed on the base substrate, a second group-III nitride layer produced from InxxAlyyGazzN (xx+yy+zz=1, 0=xx=1, 0<yy=1, 0<zz=1) and formed on the first group-III nitride layer, and at least one third group-III nitride layer epitaxially formed on the second group-III nitride layer, wherein the first group-III nitride layer is a layer containing multiple defects, which is configured from at least one type of columnar or granular crystals or domains, and the interface between the first group-III nitride layer and the second group-III nitride layer is a three-dimensional corrugated surface. |
申请公布号 |
WO2011016304(A1) |
申请公布日期 |
2011.02.10 |
申请号 |
WO2010JP61148 |
申请日期 |
2010.06.30 |
申请人 |
NGK INSULATORS, LTD.;SUMIYA SHIGEAKI;MIYOSHI MAKOTO;SUGIYAMA TOMOHIKO;ICHIMURA MIKIYA;KURAOKA YOSHITAKA;TANAKA MITSUHIRO |
发明人 |
SUMIYA SHIGEAKI;MIYOSHI MAKOTO;SUGIYAMA TOMOHIKO;ICHIMURA MIKIYA;KURAOKA YOSHITAKA;TANAKA MITSUHIRO |
分类号 |
H01L21/205;C23C16/34;H01L21/338;H01L29/47;H01L29/778;H01L29/812;H01L29/872 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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