| 摘要 |
An image classification system configured to classify a target and method thereof is provided, wherein the system includes at least one light source configured to emit light with at least one line pattern towards the target, wherein at least a portion of the emitted light and line pattern is reflected by the target. The system further includes an imager configured to receive at least a portion of the reflected light and line pattern, such that an obtained 2-D line pattern is produced that is representative of at least a portion of the emitted light and line pattern reflected by the target, and a controller configured to compare the 2-D line pattern to at least one previously obtained 2-D line pattern stored in a database, such that the controller classifies the 2-D line pattern as a function of the comparison.
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