发明名称 POLARIZATION EVALUATION MASK, EXPOSURE DEVICE, AND POLARIZATION EVALUATION METHOD
摘要 Polarization evaluation mask according to one mode includes a transparent substrate, a light shielding portion, plural quarter-wavelength plates, and plural polarizers. The light shielding portion is formed on the transparent substrate and has plural openings therein. Plural quarter-wavelength plates are formed to cover at least one opening. Fast axes of the quarter-wavelength plates are different in azimuth by a certain angle. Plural polarizers are disposed upstream of the quarter-wavelength plates with respect to the illumination light and formed to overlay the quarter-wavelength plates and cover at least one of the openings. Transmission axes of the polarizers are different in azimuth by a certain angle. The plural openings are provided with different combinations of an azimuth, of the polarizer and an azimuth of the quarter-wavelength plate from one another.
申请公布号 US2011032502(A1) 申请公布日期 2011.02.10
申请号 US20100852201 申请日期 2010.08.06
申请人 NOMURA HIROSHI 发明人 NOMURA HIROSHI
分类号 G03B27/72;G01J4/00;G03F1/44;H01L21/027 主分类号 G03B27/72
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