发明名称 PATTERN FORMATION METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 According to one embodiment, a pattern formation method is disclosed. The method includes forming a plurality of regions on a foundation and the plurality of the regions correspond to different pattern sizes. The method includes separating each of a plurality of block copolymers from another one of the plurality of the block copolymers and segregating the each of the plurality of the block copolymers into a corresponding one of the regions. The method includes performing a phase separation of the each of the block copolymers of each of the regions. The method includes selectively removing a designated phase of each of the phase-separated block copolymers to form a pattern of the each of the block copolymers and the pattern has a different pattern size for the each of the regions.
申请公布号 US2011034029(A1) 申请公布日期 2011.02.10
申请号 US20100849599 申请日期 2010.08.03
申请人 MATSUNAGA KENTARO;OORI TOMOYA;SHIOBARA EISHI;SATO YUKIKO;KAWAMURA YOSHIHISA 发明人 MATSUNAGA KENTARO;OORI TOMOYA;SHIOBARA EISHI;SATO YUKIKO;KAWAMURA YOSHIHISA
分类号 H01L21/306 主分类号 H01L21/306
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