| 摘要 |
Provided is a test apparatus that tests a device under test, comprising a power supply that generates power supplied to the device under test; a transmission path that transmits the power generated by the power supply to the device under test; a current measuring section that measures a digital waveform of load current supplied to the device under test via the transmission path, the digital waveform including a frequency component higher than a frequency corresponding to a product of an inductance component of the power supply and a capacitance component between the transmission path and a ground potential; and a judging section that judges acceptability of the device under test based on the digital waveform of the load current measured by the current measuring section.
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