发明名称 METAL TIP FOR SCANNING PROBE APPLICATIONS AND METHOD OF PRODUCING THE SAME
摘要 <p>A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 µg or less.</p>
申请公布号 WO2011015378(A1) 申请公布日期 2011.02.10
申请号 WO2010EP04915 申请日期 2010.08.02
申请人 SPECS SURFACE NANO ANALYSIS GMBH;LAEGSGAARD, ERIK 发明人 LAEGSGAARD, ERIK
分类号 G01Q70/10;G01Q70/16 主分类号 G01Q70/10
代理机构 代理人
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