发明名称 METHOD FOR MANUFACTURING SIMOX WAFER AND SIMOX WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a SIMOX wafer having a BOX layer locally formed thereon, the method holding surface flatness excellent with good reproducibility through simple steps. SOLUTION: The method for manufacturing the SIMOX wafer includes: a step of forming a mask layer on one surface side of the wafer, which has an opening on a region where a BOX layer is to be formed; a step of implanting oxygen ions through the opening of the mask layer into the silicon single crystal wafer to a predetermined depth, and locally forming an oxygen implantation region; an annealing step of annealing the wafer with the mask layer, and oxidizing the oxygen implantation region so as to form the BOX layer; and an oxide film removing step of removing a coated oxide film that covers the whole wafer which is formed in the annealing process, wherein the mask layer has a lamination comprising at least an oxide film and either one or both of a polysilicon film and an amorphous silicon film. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011029618(A) 申请公布日期 2011.02.10
申请号 JP20100142214 申请日期 2010.06.23
申请人 SUMCO CORP 发明人 NAKAI TETSUYA
分类号 H01L27/12;H01L21/02;H01L21/265;H01L21/266;H01L21/76 主分类号 H01L27/12
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