发明名称 |
METHOD FOR FORMING NONVOLATILE MEMORY DEVICE |
摘要 |
<p>PURPOSE: A nonvolatile memory device forming method is provided to obtain the stabilization of a process by minimizing the generation of LER by implementing the repetition of in-situ photoresist sliming and etching in the etching chamber. CONSTITUTION: A stack including a conductive film and an insulating layer is deposited repetitively on a substrate. A photosensitive pattern is formed on the deposited stack. The top most stack is etched using the photosensitive pattern as the etching barrier wall. The break through etching is implemented. The photosensitive pattern is slimmed.</p> |
申请公布号 |
KR20110013154(A) |
申请公布日期 |
2011.02.09 |
申请号 |
KR20090117425 |
申请日期 |
2009.11.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, HYE RAN;CHO, SUNG YOON |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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