发明名称 CONTACT PROBE DEVICE
摘要 <p>To obtain a satisfactory contact state in an ultra high frequency range with a low loss, in a contact probe device with an electronic component connected to a mounting substrate. Insulating substrate 1 has cuts 3 with narrow width formed from an outer peripheral end. Cylindrical electrodes 9 are made of a conductive material and have slits 9a extending in its axial direction. A plurality of cylindrical electrodes 9 are supported by the insulating substrate 1 in such a manner as being inserted into each cuts 3 so that the insulating substrate 1 is fitted into each slit 9a.</p>
申请公布号 EP2282381(A1) 申请公布日期 2011.02.09
申请号 EP20080777029 申请日期 2008.05.30
申请人 ELMEC CORPORATION 发明人 SHIGA, MOTOTSUGU
分类号 H01R33/76;H01R11/01 主分类号 H01R33/76
代理机构 代理人
主权项
地址