| 摘要 |
PURPOSE: A test device having variable-frequency clock generator and a test method are provided to test plural chips by adjusting a frequency clock by connecting the variable frequency clock generator to a main board. CONSTITUTION: A variable frequency clock generator(110) generates a frequency clock, and a clock frequency multiplier(121) is electrically connected to the variable frequency clock generator to rearrange the clock frequencies. At least one test socket(123) is electrically connected to the clock frequency multiplier to provide the clock frequencies to a test chips. A central processing unit(122) is electrically connected to an input unit(140) which inputs the frequency clocks and a monitor which displays the frequency clocks.
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