发明名称 Methods for fabricating image sensor devices
摘要 Image sensor devices and methods for fabricating the same are provided. An exemplary embodiment of an image sensor device comprises a support substrate. A passivation structure is formed over the support substrate. An interconnect structure is formed over the passivation structure. A first semiconductor layer is formed over the interconnect structure, having a first and second surfaces, wherein the first and second surfaces are opposing surfaces. At least one light-sensing device is formed over/in the first semiconductor layer from a first surface thereof. A color filter layer is formed over the first semiconductor layer from a second surface thereof. At least one micro lens is formed over the color filter layer.
申请公布号 US7883926(B2) 申请公布日期 2011.02.08
申请号 US20100710441 申请日期 2010.02.23
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 SHIAU GWO-YUH;LIU MING-CHYI;HSIEH YUAN-CHIH;FU SHIH-CHI;TSAI CHIA-SHIUNG
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址